Scanning Electron Microscopy Laboratory
The scanning electron microscope (SEM) and specimen preparation instruments are located in the Robert Mahoney Electron Microscopy Laboratory, a 1,200 sq ft, 5-room, modern electron microscopy suite. The SEM, a JEOL 6480LV, was purchased with funds from the National Science Foundation.
Specifications of the JEOL 6480LV SEM:
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Illumination System:
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Tungsten Filament
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Accelerating Voltage:
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1-30 kV
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Sample Holders:
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4 and 8 hole
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Detectors:
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Secondary and backscatter detectors
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Modes:
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High and low vac imaging, cryo-stage for LV-cryo imaging
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X-ray Microanalysis:
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Bruker-AXS EDX system with X-ray mapping
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Ancillary Equipment:
- Two ultramicrotomes: Reichert Ultracut E and Leica
- Sputter coater
- Critical point dryer
- LKB knife maker
- BalTec JFD 030 Jet Freezer
Equipment is also available for freeze spraying, freeze slamming, freeze substitution (to 90C) and low temperature plastic embedding.